Input vector monitoring concurrent BIST with Low hardware overhead

نویسنده

  • I. Voyiatzis
چکیده

Built-In Self-Test (BIST) techniques constitute an attractive and practical solution to the problem of testing VLSI circuits and systems. Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this paper a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.

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تاریخ انتشار 2013